Dual EMAT and PEC non-contact probe: applications to defect testing
For many non-destructive testing (NDT) applications, more information and greater reliability can be gained by using different techniques for defect detection, especially when the methods are particularly sensitive to different types of defects. However, this will often lead to a much longer and mor...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2006
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/46714/ http://irep.iium.edu.my/46714/ http://irep.iium.edu.my/46714/1/Dual_EMAT_and_PEC_non-contact_probe.pdf |