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  1. 1
    Data fusion for defect characterisation using a dual probe system
    Data fusion for defect characterisation using a dual probe system
    by Edwards, R.S., Sophian, Ali, Dixon, S., Tian, G.Y.
    Published 2008
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  2. 2
    Dual EMAT and PEC non-contact probe: applications to defect testing
    Dual EMAT and PEC non-contact probe: applications to defect testing
    by Edwards, R.S., Sophian, Ali, Dixon, S., Tian, G.-Y., Jian, X.
    Published 2006
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