Data fusion for defect characterisation using a dual probe system

by Edwards, R.S., Sophian, Ali, Dixon, S., Tian, G.Y.
Published 2008

Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT

by Tian, G.Y., Sophian, Ali, Taylor, D., Rudlin, J.
Published 2005

Dual EMAT and PEC non-contact probe: applications to defect testing

by Edwards, R.S., Sophian, Ali, Dixon, S., Tian, G.-Y., Jian, X.
Published 2006