Physical properties of cuprous oxide thin films grown on n-Si substrate by Sol-Gel spin coating
Cu2O films were grown on n-Si substrates via the sol-gel spin-coating method. The films were annealed under 5% H2 + 95% N2 atmosphere at 350°C, 450°C and 550°C. Diffractogram obtained by the grazing angle x-ray diffractometry showed that the crystallinity of the films increased with increasing anne...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Universiti Kebangsaan Malaysia
2009
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| Online Access: | http://journalarticle.ukm.my/67/ http://journalarticle.ukm.my/67/ http://journalarticle.ukm.my/67/1/ |