A new scanning method for fast atomic force microscopy

In recent years, the atomic force microscope (AFM) has become an important tool in nanotechnology research. It was first conceived to generate 3-D images of conducting as well as nonconducting surfaces with a high degree of accuracy. Presently, it is also being used in applications that involve mani...

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Main Authors:	Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza, Bhikkaji, Bharath
Format:	Article
Language:	English
Published:	Institute of Electrical and Electronics Engineers ( IEEE ) 2011
Subjects:	QH Natural history
Online Access:	http://irep.iium.edu.my/559/ http://irep.iium.edu.my/559/ http://irep.iium.edu.my/559/ http://irep.iium.edu.my/559/1/A_new_scanning_method_for_fast_atomic_force_microscopy.pdf

id	iium-559
recordtype	eprints
spelling	iium-5592011-07-28T03:58:28Z http://irep.iium.edu.my/559/ A new scanning method for fast atomic force microscopy Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Bhikkaji, Bharath QH Natural history In recent years, the atomic force microscope (AFM) has become an important tool in nanotechnology research. It was first conceived to generate 3-D images of conducting as well as nonconducting surfaces with a high degree of accuracy. Presently, it is also being used in applications that involve manipulation of material surfaces at a nanoscale. In this paper, we describe a new scanning method for fast atomic force microscopy. In this technique, the sample is scanned in a spiral pattern instead of the well-established raster pattern. A constant angular velocity spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x-axis and y -axis of AFM nanopositioner, respectively. The use of single-frequency input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device. Alternatively, the frequency of the sinusoidal set points can be varied to maintain a constant linear velocity (CLV) while a spiral trajectory is being traced. Thus, producing a CLV spiral. These scan methods can be incorporated into most modern AFMs with minimal effort since they can be implemented in software using the existing hardware. Experimental results obtained by implementing the method on a commercial AFM indicate that high-quality images can be generated at scan frequencies well beyond the raster scans. Institute of Electrical and Electronics Engineers ( IEEE ) 2011-03 Article PeerReviewed application/pdf en http://irep.iium.edu.my/559/1/A_new_scanning_method_for_fast_atomic_force_microscopy.pdf Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza and Bhikkaji, Bharath (2011) A new scanning method for fast atomic force microscopy. IEEE Transactions on Nanotechnology, 10 (2). 203 -216. ISSN 1536-125X http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7729 10.1109/TNANO.2009.2036844
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English
topic	QH Natural history
spellingShingle	QH Natural history Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Bhikkaji, Bharath A new scanning method for fast atomic force microscopy
description	In recent years, the atomic force microscope (AFM) has become an important tool in nanotechnology research. It was first conceived to generate 3-D images of conducting as well as nonconducting surfaces with a high degree of accuracy. Presently, it is also being used in applications that involve manipulation of material surfaces at a nanoscale. In this paper, we describe a new scanning method for fast atomic force microscopy. In this technique, the sample is scanned in a spiral pattern instead of the well-established raster pattern. A constant angular velocity spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x-axis and y -axis of AFM nanopositioner, respectively. The use of single-frequency input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device. Alternatively, the frequency of the sinusoidal set points can be varied to maintain a constant linear velocity (CLV) while a spiral trajectory is being traced. Thus, producing a CLV spiral. These scan methods can be incorporated into most modern AFMs with minimal effort since they can be implemented in software using the existing hardware. Experimental results obtained by implementing the method on a commercial AFM indicate that high-quality images can be generated at scan frequencies well beyond the raster scans.
format	Article
author	Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Bhikkaji, Bharath
author_facet	Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Bhikkaji, Bharath
author_sort	Mahmood, Iskandar Al-Thani
title	A new scanning method for fast atomic force microscopy
title_short	A new scanning method for fast atomic force microscopy
title_full	A new scanning method for fast atomic force microscopy
title_fullStr	A new scanning method for fast atomic force microscopy
title_full_unstemmed	A new scanning method for fast atomic force microscopy
title_sort	new scanning method for fast atomic force microscopy
publisher	Institute of Electrical and Electronics Engineers ( IEEE )
publishDate	2011
url	http://irep.iium.edu.my/559/ http://irep.iium.edu.my/559/ http://irep.iium.edu.my/559/ http://irep.iium.edu.my/559/1/A_new_scanning_method_for_fast_atomic_force_microscopy.pdf
first_indexed	2023-09-18T20:07:41Z
last_indexed	2023-09-18T20:07:41Z
_version_	1777407268691640320

A new scanning method for fast atomic force microscopy

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