Tracking control of a nanopositioner using complementary sensors
Piezoelectric tube actuators are widely used in atomic force and scanning tunneling microscopy (STM) for nanoscale positioning. There has been a consistent effort to increase the scan speed of these actuators using feedback control techniques. A feedback controller requires a measurement of the scan...
Main Authors: | Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza, Liu, Kexiu |
---|---|
Format: | Article |
Language: | English |
Published: |
Institute of Electrical and Electronics Engineers (IEEE)
2009
|
Subjects: | |
Online Access: | http://irep.iium.edu.my/5210/ http://irep.iium.edu.my/5210/ http://irep.iium.edu.my/5210/ http://irep.iium.edu.my/5210/1/Tracking_Control_of_a_Nanopositioner_Using_Complementary_Sensors.pdf |
Similar Items
-
Diagonal control design for atomic force microscope piezoelectric tube nanopositioners
by: Bhikkaji, Bharath, et al.
Published: (2013) -
Two sensor based H-infinity control of a piezoelectric tube scanner
by: Mahmood, Iskandar Al-Thani, et al.
Published: (2008) -
Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control
by: Mahmood, Iskandar Al-Thani, et al.
Published: (2009) -
Making a commercial atomic force microscope more accurate and faster using positive position feedback control
by: Mahmood, Iskandar Al-Thani, et al.
Published: (2009) -
Spiral-scan atomic force microscopy: a constant linear velocity approach
by: Mahmood, Iskandar Al-Thani, et al.
Published: (2010)