Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT
A new approach for defect classification and quantification by using pulsed eddy current sensors and integration of principal component analysis and wavelet transform for feature based signal interpretation is presented. After reviewing the limitation of current parameters of peak value and its arri...
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iium-470122016-01-14T08:07:10Z http://irep.iium.edu.my/47012/ Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT Tian, G.Y. Sophian, Ali Taylor, D. Rudlin, J. TK Electrical engineering. Electronics Nuclear engineering A new approach for defect classification and quantification by using pulsed eddy current sensors and integration of principal component analysis and wavelet transform for feature based signal interpretation is presented. After reviewing the limitation of current parameters of peak value and its arrival time from pulsed eddy current signals, a two-step framework for defect classification and quantification is proposed by using adopted features from principal component analysis and wavelet analysis. For defect classification and quantification, different features have been extracted from the pulsed eddy current signals. Experimental tests have been undertaken for ferrous and non-ferrous metal samples with manufactured defects. The results have illustrated the new approach has better performance than the current approaches for surface and sub-surface defect classification. The defect quantification performance, which is difficult by using current approaches, is impressive. Institute of Electrical Engineers 2005-07 Article PeerReviewed application/pdf en http://irep.iium.edu.my/47012/1/iet_Wavelet-based_PCA_defect_classification.pdf Tian, G.Y. and Sophian, Ali and Taylor, D. and Rudlin, J. (2005) Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT. Science, Measurement and Technology, IEE Proceedings -, 152 (4). pp. 141-148. ISSN 1350-234 |
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language |
English |
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TK Electrical engineering. Electronics Nuclear engineering |
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TK Electrical engineering. Electronics Nuclear engineering Tian, G.Y. Sophian, Ali Taylor, D. Rudlin, J. Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT |
description |
A new approach for defect classification and quantification by using pulsed eddy current sensors and integration of principal component analysis and wavelet transform for feature based signal interpretation is presented. After reviewing the limitation of current parameters of peak value and its arrival time from pulsed eddy current signals, a two-step framework for defect classification and quantification is proposed by using adopted features from principal component analysis and wavelet analysis. For defect classification and quantification, different features have been extracted from the pulsed eddy current signals. Experimental tests have been undertaken for ferrous and non-ferrous metal samples with manufactured defects. The results have illustrated the new approach has better performance than the current approaches for surface and sub-surface defect classification. The defect quantification performance, which is difficult by using current approaches, is impressive. |
format |
Article |
author |
Tian, G.Y. Sophian, Ali Taylor, D. Rudlin, J. |
author_facet |
Tian, G.Y. Sophian, Ali Taylor, D. Rudlin, J. |
author_sort |
Tian, G.Y. |
title |
Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT |
title_short |
Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT |
title_full |
Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT |
title_fullStr |
Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT |
title_full_unstemmed |
Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT |
title_sort |
wavelet-based pca defect classification and quantification for pulsed eddy current ndt |
publisher |
Institute of Electrical Engineers |
publishDate |
2005 |
url |
http://irep.iium.edu.my/47012/ http://irep.iium.edu.my/47012/1/iet_Wavelet-based_PCA_defect_classification.pdf |
first_indexed |
2023-09-18T21:06:54Z |
last_indexed |
2023-09-18T21:06:54Z |
_version_ |
1777410993901535232 |