A modular system of deep level transient spectroscopy
Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequenc...
| Main Authors: | , |
|---|---|
| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2011
|
| Subjects: | |
| Online Access: | http://irep.iium.edu.my/36427/ http://irep.iium.edu.my/36427/ http://irep.iium.edu.my/36427/1/iccaie.pdf |