Test Data Generation for Event Driven System Using Bees Algorithm

For an event driven system, the order of the event sequence should also be tested to detect failure in any possible sequences of the event. In many real time or reactive system, some faults do occur as a result interactions of some particular order of the inputs or events. In some other systems,...

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Main Authors:	Mohammed Zabil, Mohd H., Kamal Z., Zamli
Format:	Conference or Workshop Item
Language:	English
Published:	2013
Subjects:	QA75 Electronic computers. Computer science
Online Access:	http://umpir.ump.edu.my/id/eprint/6942/ http://umpir.ump.edu.my/id/eprint/6942/1/Paper_1.pdf

id	ump-6942
recordtype	eprints
spelling	ump-69422018-01-16T01:43:23Z http://umpir.ump.edu.my/id/eprint/6942/ Test Data Generation for Event Driven System Using Bees Algorithm Mohammed Zabil, Mohd H. Kamal Z., Zamli QA75 Electronic computers. Computer science For an event driven system, the order of the event sequence should also be tested to detect failure in any possible sequences of the event. In many real time or reactive system, some faults do occur as a result interactions of some particular order of the inputs or events. In some other systems, sequence of inputs produce significant results to how such system process the inputs and produce the output. For these types of systems, fault might be triggered from a particular order of the input sequence, entered or given to the system. . In this paper we discuss and proposed a new strategy for generating test data for event-driven system using a bio inspired artificial intelligent, namely Bees Algorithm (BA). We discussed the implementation of BA and benchmark it with the existing approaches. 2013-07 Conference or Workshop Item PeerReviewed application/pdf en http://umpir.ump.edu.my/id/eprint/6942/1/Paper_1.pdf Mohammed Zabil, Mohd H. and Kamal Z., Zamli (2013) Test Data Generation for Event Driven System Using Bees Algorithm. In: Postgraduate Research Workshop @ SOFTEC 2013 , Kuala Lumpur. pp. 1-6..
repository_type	Digital Repository
institution_category	Local University
institution	Universiti Malaysia Pahang
building	UMP Institutional Repository
collection	Online Access
language	English
topic	QA75 Electronic computers. Computer science
spellingShingle	QA75 Electronic computers. Computer science Mohammed Zabil, Mohd H. Kamal Z., Zamli Test Data Generation for Event Driven System Using Bees Algorithm
description	For an event driven system, the order of the event sequence should also be tested to detect failure in any possible sequences of the event. In many real time or reactive system, some faults do occur as a result interactions of some particular order of the inputs or events. In some other systems, sequence of inputs produce significant results to how such system process the inputs and produce the output. For these types of systems, fault might be triggered from a particular order of the input sequence, entered or given to the system. . In this paper we discuss and proposed a new strategy for generating test data for event-driven system using a bio inspired artificial intelligent, namely Bees Algorithm (BA). We discussed the implementation of BA and benchmark it with the existing approaches.
format	Conference or Workshop Item
author	Mohammed Zabil, Mohd H. Kamal Z., Zamli
author_facet	Mohammed Zabil, Mohd H. Kamal Z., Zamli
author_sort	Mohammed Zabil, Mohd H.
title	Test Data Generation for Event Driven System Using Bees Algorithm
title_short	Test Data Generation for Event Driven System Using Bees Algorithm
title_full	Test Data Generation for Event Driven System Using Bees Algorithm
title_fullStr	Test Data Generation for Event Driven System Using Bees Algorithm
title_full_unstemmed	Test Data Generation for Event Driven System Using Bees Algorithm
title_sort	test data generation for event driven system using bees algorithm
publishDate	2013
url	http://umpir.ump.edu.my/id/eprint/6942/ http://umpir.ump.edu.my/id/eprint/6942/1/Paper_1.pdf
first_indexed	2023-09-18T22:03:06Z
last_indexed	2023-09-18T22:03:06Z
_version_	1777414529810956288

Test Data Generation for Event Driven System Using Bees Algorithm

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