An efficient approach for vision inspection of IC chips

The research aims to develop an automated vision inspection system of IC chips that used to detect the defects of marking and design shape of IC chips.As a result of higher failure probability of manual inspection system, this automated system is developed.The automated vision system will consists o...

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Main Author:	Kok Wah, Liew
Format:	Undergraduates Project Papers
Language:	English
Published:	2012
Subjects:	TA Engineering (General). Civil engineering (General)
Online Access:	http://umpir.ump.edu.my/id/eprint/4418/ http://umpir.ump.edu.my/id/eprint/4418/ http://umpir.ump.edu.my/id/eprint/4418/1/CD6551_LIEW_KOK_WAH.pdf

id	ump-4418
recordtype	eprints
spelling	ump-44182015-03-03T09:18:56Z http://umpir.ump.edu.my/id/eprint/4418/ An efficient approach for vision inspection of IC chips Kok Wah, Liew TA Engineering (General). Civil engineering (General) The research aims to develop an automated vision inspection system of IC chips that used to detect the defects of marking and design shape of IC chips.As a result of higher failure probability of manual inspection system, this automated system is developed.The automated vision system will consists of five main phases which are image acquisition, image enhancement,image,segmentation, comparison on features and decision making.The features will be extracted from the target image using projection profile method.The decision will be made using the trained neural network to identify the four common defects of IC chips which are illegible marking,upside down marking and missing character on chip. The results of the automated system are to determine whether to accept or reject the chip. The results are computed within 10 seconds and have a high percentage of defects detection which is about 95 %. Through the results obtained, the automated vision inspection system of IC chips can be utilized in the manufacturing field to replace the manual inspection system.It can replace about five to eight inspection experts to reduce the cost of hiring and resources in about 70%. Other than that, the rate of accuracy and efficiency of detecting the defects are improved by 95% because the consistency of inspecting the chips is maintained from having variations of judgments by the experts. 2012-06 Undergraduates Project Papers NonPeerReviewed application/pdf en http://umpir.ump.edu.my/id/eprint/4418/1/CD6551_LIEW_KOK_WAH.pdf Kok Wah, Liew (2012) An efficient approach for vision inspection of IC chips. Faculty of Computer System & Software Engineering, Universiti Malaysia Pahang. http://iportal.ump.edu.my/lib/item?id=chamo:67664&theme=UMP2
repository_type	Digital Repository
institution_category	Local University
institution	Universiti Malaysia Pahang
building	UMP Institutional Repository
collection	Online Access
language	English
topic	TA Engineering (General). Civil engineering (General)
spellingShingle	TA Engineering (General). Civil engineering (General) Kok Wah, Liew An efficient approach for vision inspection of IC chips
description	The research aims to develop an automated vision inspection system of IC chips that used to detect the defects of marking and design shape of IC chips.As a result of higher failure probability of manual inspection system, this automated system is developed.The automated vision system will consists of five main phases which are image acquisition, image enhancement,image,segmentation, comparison on features and decision making.The features will be extracted from the target image using projection profile method.The decision will be made using the trained neural network to identify the four common defects of IC chips which are illegible marking,upside down marking and missing character on chip. The results of the automated system are to determine whether to accept or reject the chip. The results are computed within 10 seconds and have a high percentage of defects detection which is about 95 %. Through the results obtained, the automated vision inspection system of IC chips can be utilized in the manufacturing field to replace the manual inspection system.It can replace about five to eight inspection experts to reduce the cost of hiring and resources in about 70%. Other than that, the rate of accuracy and efficiency of detecting the defects are improved by 95% because the consistency of inspecting the chips is maintained from having variations of judgments by the experts.
format	Undergraduates Project Papers
author	Kok Wah, Liew
author_facet	Kok Wah, Liew
author_sort	Kok Wah, Liew
title	An efficient approach for vision inspection of IC chips
title_short	An efficient approach for vision inspection of IC chips
title_full	An efficient approach for vision inspection of IC chips
title_fullStr	An efficient approach for vision inspection of IC chips
title_full_unstemmed	An efficient approach for vision inspection of IC chips
title_sort	efficient approach for vision inspection of ic chips
publishDate	2012
url	http://umpir.ump.edu.my/id/eprint/4418/ http://umpir.ump.edu.my/id/eprint/4418/ http://umpir.ump.edu.my/id/eprint/4418/1/CD6551_LIEW_KOK_WAH.pdf
first_indexed	2023-09-18T21:58:59Z
last_indexed	2023-09-18T21:58:59Z
_version_	1777414270386962432

An efficient approach for vision inspection of IC chips

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