Enhancement the voltage clamp technique under noisy input currents

Our brains keep working despite frequent failures of their component neurons, and this ‘fault-tolerant’ characteristic is of great interest to engineers who wish to make computers more reliable. Neuroscience is by far the most exciting branch of science because the brain is the most fascinating obje...

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Bibliographic Details
Main Authors:	Khudhur, Ahmed Mahmood, Naif, Yasir Hashim, Khdher, Abdolbaqi Mohammed
Format:	Book
Language:	English
Published:	LAP LAMBERT Academic Publishing 2017
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://umpir.ump.edu.my/id/eprint/19278/ http://umpir.ump.edu.my/id/eprint/19278/ http://umpir.ump.edu.my/id/eprint/19278/1/978-3-330-33515-8-full.jpg

id	ump-19278
recordtype	eprints
spelling	ump-192782018-10-16T02:42:03Z http://umpir.ump.edu.my/id/eprint/19278/ Enhancement the voltage clamp technique under noisy input currents Khudhur, Ahmed Mahmood Naif, Yasir Hashim Khdher, Abdolbaqi Mohammed TK Electrical engineering. Electronics Nuclear engineering Our brains keep working despite frequent failures of their component neurons, and this ‘fault-tolerant’ characteristic is of great interest to engineers who wish to make computers more reliable. Neuroscience is by far the most exciting branch of science because the brain is the most fascinating object in the universe. Every human brain is different - the brain makes each human unique and defines who he or she is. LAP LAMBERT Academic Publishing 2017-06-19 Book PeerReviewed image/jpeg en http://umpir.ump.edu.my/id/eprint/19278/1/978-3-330-33515-8-full.jpg Khudhur, Ahmed Mahmood and Naif, Yasir Hashim and Khdher, Abdolbaqi Mohammed (2017) Enhancement the voltage clamp technique under noisy input currents. LAP LAMBERT Academic Publishing. ISBN 978-3-330-33515-8 https://www.morebooks.de/store/gb/book/enhancement-the-voltage-clamp-technique-under-noisy-input-currents/isbn/978-3-330-33515-8
repository_type	Digital Repository
institution_category	Local University
institution	Universiti Malaysia Pahang
building	UMP Institutional Repository
collection	Online Access
language	English
topic	TK Electrical engineering. Electronics Nuclear engineering
spellingShingle	TK Electrical engineering. Electronics Nuclear engineering Khudhur, Ahmed Mahmood Naif, Yasir Hashim Khdher, Abdolbaqi Mohammed Enhancement the voltage clamp technique under noisy input currents
description	Our brains keep working despite frequent failures of their component neurons, and this ‘fault-tolerant’ characteristic is of great interest to engineers who wish to make computers more reliable. Neuroscience is by far the most exciting branch of science because the brain is the most fascinating object in the universe. Every human brain is different - the brain makes each human unique and defines who he or she is.
format	Book
author	Khudhur, Ahmed Mahmood Naif, Yasir Hashim Khdher, Abdolbaqi Mohammed
author_facet	Khudhur, Ahmed Mahmood Naif, Yasir Hashim Khdher, Abdolbaqi Mohammed
author_sort	Khudhur, Ahmed Mahmood
title	Enhancement the voltage clamp technique under noisy input currents
title_short	Enhancement the voltage clamp technique under noisy input currents
title_full	Enhancement the voltage clamp technique under noisy input currents
title_fullStr	Enhancement the voltage clamp technique under noisy input currents
title_full_unstemmed	Enhancement the voltage clamp technique under noisy input currents
title_sort	enhancement the voltage clamp technique under noisy input currents
publisher	LAP LAMBERT Academic Publishing
publishDate	2017
url	http://umpir.ump.edu.my/id/eprint/19278/ http://umpir.ump.edu.my/id/eprint/19278/ http://umpir.ump.edu.my/id/eprint/19278/1/978-3-330-33515-8-full.jpg
first_indexed	2023-09-18T22:27:38Z
last_indexed	2023-09-18T22:27:38Z
_version_	1777416073597943808

Enhancement the voltage clamp technique under noisy input currents

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