High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method

High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method

High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity wi...

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Main Authors: Ibrahim, N.B., Baqiah, H., Abdullah, M.H.
Format: Article
Language:English
Published: Universiti Kebangsaan Malaysia 2013
Online Access:http://journalarticle.ukm.my/6313/
http://journalarticle.ukm.my/6313/
http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf
id ukm-6313
recordtype eprints
spelling ukm-63132016-12-14T06:40:49Z http://journalarticle.ukm.my/6313/ High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method Ibrahim, N.B. Baqiah, H. Abdullah, M.H. High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity with a preferred orientation in the (222) direction. The crystallite size increased from 12.1 nm for the pure sample to 16.1 nm for the sample with x=0.35 and then decreased to 12.1 nm for the sample with x=0.45. All samples contained nanometer grain sizes with a smooth surface. All films showed a high transmission of over 91% in the wavelength range of 200-800 nm. Universiti Kebangsaan Malaysia 2013-07 Article PeerReviewed application/pdf en http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf Ibrahim, N.B. and Baqiah, H. and Abdullah, M.H. (2013) High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method. Sains Malaysiana, 42 (7). pp. 961-966. ISSN 0126-6039 http://www.ukm.my/jsm/
repository_type Digital Repository
institution_category Local University
institution Universiti Kebangasaan Malaysia
building UKM Institutional Repository
collection Online Access
language English
description High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity with a preferred orientation in the (222) direction. The crystallite size increased from 12.1 nm for the pure sample to 16.1 nm for the sample with x=0.35 and then decreased to 12.1 nm for the sample with x=0.45. All samples contained nanometer grain sizes with a smooth surface. All films showed a high transmission of over 91% in the wavelength range of 200-800 nm.
format Article
author Ibrahim, N.B.
Baqiah, H.
Abdullah, M.H.
spellingShingle Ibrahim, N.B.
Baqiah, H.
Abdullah, M.H.
High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
author_facet Ibrahim, N.B.
Baqiah, H.
Abdullah, M.H.
author_sort Ibrahim, N.B.
title High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title_short High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title_full High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title_fullStr High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title_full_unstemmed High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title_sort high transparency iron doped indium oxide (in2—xfexo3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
publisher Universiti Kebangsaan Malaysia
publishDate 2013
url http://journalarticle.ukm.my/6313/
http://journalarticle.ukm.my/6313/
http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf
first_indexed 2023-09-18T19:46:34Z
last_indexed 2023-09-18T19:46:34Z
_version_ 1777405939610025984

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