Microstructural characterization of Au-In Thin film deposited by electron beam evaporation

The microstructure and phase formation of Au-In thin film deposited by e-beam evaporation technique has been studied. Single crystals of rocksalt were used as the substrates. The chamber pressure during deposition was about 2.5  10-5 torr and substrate temperature was 35ºC. Three types of samples...

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Main Authors:	Norliza Ismail, Muhammad Azmi Abdul Hamid, Azman Jalar
Format:	Article
Language:	English
Published:	Universiti Kebangsaan Malaysia 2009
Online Access:	http://journalarticle.ukm.my/62/ http://journalarticle.ukm.my/62/ http://journalarticle.ukm.my/62/1/

id	ukm-62
recordtype	eprints
spelling	ukm-622016-12-14T06:26:17Z http://journalarticle.ukm.my/62/ Microstructural characterization of Au-In Thin film deposited by electron beam evaporation Norliza Ismail, Muhammad Azmi Abdul Hamid, Azman Jalar, The microstructure and phase formation of Au-In thin film deposited by e-beam evaporation technique has been studied. Single crystals of rocksalt were used as the substrates. The chamber pressure during deposition was about 2.5  10-5 torr and substrate temperature was 35ºC. Three types of samples were prepared namely Au, In and Au-In thin films. Microstructure and chemical composition of these thin films were characterized by transmission electron microscopy (TEM) and X-ray photoelectron spectrometer (XPS) respectively. TEM micrograph reveals island structures for both Au and In thin film on the rocksalt substrate, with the In island size distribution is about 9-30 nm compared to Au island in the range of 3-10 nm. The growth of islands instead of smooth film indicates that Au and In thin films follow the Volmer- Weber growth mode. However, island structures were not present on Au-In thin films which most probably follow the Frank van de Merwe growth mode. XPS analysis indicates intermetallic compound was not present in the Au-In thin film suggesting that diffusion process in the interface of Au and In films is minimal. Universiti Kebangsaan Malaysia 2009-02 Article PeerReviewed application/pdf en http://journalarticle.ukm.my/62/1/ Norliza Ismail, and Muhammad Azmi Abdul Hamid, and Azman Jalar, (2009) Microstructural characterization of Au-In Thin film deposited by electron beam evaporation. Sains Malaysiana, 38 (1). pp. 91-94. ISSN 0126-6039 http://www.ukm.my/~jsm/utama.html
repository_type	Digital Repository
institution_category	Local University
institution	Universiti Kebangasaan Malaysia
building	UKM Institutional Repository
collection	Online Access
language	English
description	The microstructure and phase formation of Au-In thin film deposited by e-beam evaporation technique has been studied. Single crystals of rocksalt were used as the substrates. The chamber pressure during deposition was about 2.5  10-5 torr and substrate temperature was 35ºC. Three types of samples were prepared namely Au, In and Au-In thin films. Microstructure and chemical composition of these thin films were characterized by transmission electron microscopy (TEM) and X-ray photoelectron spectrometer (XPS) respectively. TEM micrograph reveals island structures for both Au and In thin film on the rocksalt substrate, with the In island size distribution is about 9-30 nm compared to Au island in the range of 3-10 nm. The growth of islands instead of smooth film indicates that Au and In thin films follow the Volmer- Weber growth mode. However, island structures were not present on Au-In thin films which most probably follow the Frank van de Merwe growth mode. XPS analysis indicates intermetallic compound was not present in the Au-In thin film suggesting that diffusion process in the interface of Au and In films is minimal.
format	Article
author	Norliza Ismail, Muhammad Azmi Abdul Hamid, Azman Jalar,
spellingShingle	Norliza Ismail, Muhammad Azmi Abdul Hamid, Azman Jalar, Microstructural characterization of Au-In Thin film deposited by electron beam evaporation
author_facet	Norliza Ismail, Muhammad Azmi Abdul Hamid, Azman Jalar,
author_sort	Norliza Ismail,
title	Microstructural characterization of Au-In Thin film deposited by electron beam evaporation
title_short	Microstructural characterization of Au-In Thin film deposited by electron beam evaporation
title_full	Microstructural characterization of Au-In Thin film deposited by electron beam evaporation
title_fullStr	Microstructural characterization of Au-In Thin film deposited by electron beam evaporation
title_full_unstemmed	Microstructural characterization of Au-In Thin film deposited by electron beam evaporation
title_sort	microstructural characterization of au-in thin film deposited by electron beam evaporation
publisher	Universiti Kebangsaan Malaysia
publishDate	2009
url	http://journalarticle.ukm.my/62/ http://journalarticle.ukm.my/62/ http://journalarticle.ukm.my/62/1/
first_indexed	2023-09-18T19:01:09Z
last_indexed	2023-09-18T19:01:09Z
_version_	1777403082301243392

Microstructural characterization of Au-In Thin film deposited by electron beam evaporation

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