Sistem pemeriksaan bantuan penglihatan mesin
The development of a machine vision system for inspection of LED devices in industrial environment is discussed in the paper. Methods to detect flaws in LED devices is emphasized. There are two problem statement i.e.: (i) inspect flaws in the LED lead frame at the end of the production line and,...
Main Authors: | Ahmad Fadzil Mohamad Hani, Chu , Jenn Weng |
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Format: | Article |
Published: |
1994
|
Online Access: | http://journalarticle.ukm.my/1312/ http://journalarticle.ukm.my/1312/ |
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