Design of large built-in self-test programmable logic arrays
This paper presents a way to optimize design of large built-in self-test (BIST) programmable logic arrays (PLAs). These PLAs can be tested at clock speed with function independent test set. Hardware overhead of the design is low compared to other techniques. In the design, test pattern generators...
| Main Authors: | , |
|---|---|
| Format: | Article |
| Published: |
1993
|
| Online Access: | http://journalarticle.ukm.my/1304/ http://journalarticle.ukm.my/1304/ |
| id |
ukm-1304 |
|---|---|
| recordtype |
eprints |
| spelling |
ukm-13042011-10-11T03:45:35Z http://journalarticle.ukm.my/1304/ Design of large built-in self-test programmable logic arrays Zahari Mohamed Darus, Iftekhar Ahmed, This paper presents a way to optimize design of large built-in self-test (BIST) programmable logic arrays (PLAs). These PLAs can be tested at clock speed with function independent test set. Hardware overhead of the design is low compared to other techniques. In the design, test pattern generators are simple shift registers connected in ring counter form. Response evaluator circuit is a signature analyzer. A two bit binary counter and two D flip-flops automate the design process and reduce the number of test control pins. The PLA can detect all stuck-at, crosspoint, bridging as well as stuck-open faults 1993 Article PeerReviewed Zahari Mohamed Darus, and Iftekhar Ahmed, (1993) Design of large built-in self-test programmable logic arrays. Jurnal Kejuruteraan, 5 . http://www.ukm.my/jkukm/index.php/jkukm |
| repository_type |
Digital Repository |
| institution_category |
Local University |
| institution |
Universiti Kebangasaan Malaysia |
| building |
UKM Institutional Repository |
| collection |
Online Access |
| description |
This paper presents a way to optimize design of large built-in self-test (BIST)
programmable logic arrays (PLAs). These PLAs can be tested at clock speed with
function independent test set. Hardware overhead of the design is low compared to
other techniques. In the design, test pattern generators are simple shift registers
connected in ring counter form. Response evaluator circuit is a signature analyzer. A
two bit binary counter and two D flip-flops automate the design process and reduce
the number of test control pins. The PLA can detect all stuck-at, crosspoint, bridging
as well as stuck-open faults |
| format |
Article |
| author |
Zahari Mohamed Darus, Iftekhar Ahmed, |
| spellingShingle |
Zahari Mohamed Darus, Iftekhar Ahmed, Design of large built-in self-test programmable logic arrays |
| author_facet |
Zahari Mohamed Darus, Iftekhar Ahmed, |
| author_sort |
Zahari Mohamed Darus, |
| title |
Design of large built-in self-test programmable logic arrays |
| title_short |
Design of large built-in self-test programmable logic arrays |
| title_full |
Design of large built-in self-test programmable logic arrays |
| title_fullStr |
Design of large built-in self-test programmable logic arrays |
| title_full_unstemmed |
Design of large built-in self-test programmable logic arrays |
| title_sort |
design of large built-in self-test programmable logic arrays |
| publishDate |
1993 |
| url |
http://journalarticle.ukm.my/1304/ http://journalarticle.ukm.my/1304/ |
| first_indexed |
2023-09-18T19:32:57Z |
| last_indexed |
2023-09-18T19:32:57Z |
| _version_ |
1777405082845839360 |