APA (7th ed.) Citation

Abdul Wahab, Y. (2008). Characterization of defects generated by copper electrochemical plating process on silicon wafers / Yasmin Abdul Wahab.

Chicago Style (17th ed.) Citation

Abdul Wahab, Yasmin. Characterization of Defects Generated by Copper Electrochemical Plating Process on Silicon Wafers / Yasmin Abdul Wahab. 2008.

MLA (8th ed.) Citation

Abdul Wahab, Yasmin. Characterization of Defects Generated by Copper Electrochemical Plating Process on Silicon Wafers / Yasmin Abdul Wahab. 2008.

Warning: These citations may not always be 100% accurate.