Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate

Electrical properties of PECVD produced poly-Si photovoltaic layers on the various textured substrates showing the light trapping effect have been investigated using an AC-conductivity technique. From temperature dependence of electron (hole) conductivities using n-i-n (p-i-p) structures, the Fermi...

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Main Authors:	Muhida, Riza, Sutjipto, Agus Geter Edy, Matsui, T., Toyama, T., Okamoto, H.
Format:	Conference or Workshop Item
Language:	English
Published:	2006
Subjects:	TK452 Electric apparatus and materials. Electric circuits. Electric networks
Online Access:	http://irep.iium.edu.my/9439/ http://irep.iium.edu.my/9439/1/Poly_Si_-_IEEE_2006.pdf

id	iium-9439
recordtype	eprints
spelling	iium-94392012-04-04T04:19:32Z http://irep.iium.edu.my/9439/ Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate Muhida, Riza Sutjipto, Agus Geter Edy Matsui, T. Toyama, T. Okamoto, H. TK452 Electric apparatus and materials. Electric circuits. Electric networks Electrical properties of PECVD produced poly-Si photovoltaic layers on the various textured substrates showing the light trapping effect have been investigated using an AC-conductivity technique. From temperature dependence of electron (hole) conductivities using n-i-n (p-i-p) structures, the Fermi level of the poly-Si layer on the slightly textured substrates is found to locate at the center of the band gap and this material is 'truly' intrinsic. As RMS roughness of the textured substrate, q increases, the Fermi level becomes close to conduction band edge, and finally, the poly-Si layer on the highly textured substrate exhibits n-type character even though any deposition conditions for the poly-Si layers are not changed at all. Changes in electrical conductivities of the poly-Si thin films in conjunction with the results on photovoltaic performances and microstructure are also discussed. 2006 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/9439/1/Poly_Si_-_IEEE_2006.pdf Muhida, Riza and Sutjipto, Agus Geter Edy and Matsui, T. and Toyama, T. and Okamoto, H. (2006) Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate. In: 8th International Conference on Properties and Applications of Dielectric Materials, 26 - 30 June 2006, Bali, Indonesia.
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English
topic	TK452 Electric apparatus and materials. Electric circuits. Electric networks
spellingShingle	TK452 Electric apparatus and materials. Electric circuits. Electric networks Muhida, Riza Sutjipto, Agus Geter Edy Matsui, T. Toyama, T. Okamoto, H. Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate
description	Electrical properties of PECVD produced poly-Si photovoltaic layers on the various textured substrates showing the light trapping effect have been investigated using an AC-conductivity technique. From temperature dependence of electron (hole) conductivities using n-i-n (p-i-p) structures, the Fermi level of the poly-Si layer on the slightly textured substrates is found to locate at the center of the band gap and this material is 'truly' intrinsic. As RMS roughness of the textured substrate, q increases, the Fermi level becomes close to conduction band edge, and finally, the poly-Si layer on the highly textured substrate exhibits n-type character even though any deposition conditions for the poly-Si layers are not changed at all. Changes in electrical conductivities of the poly-Si thin films in conjunction with the results on photovoltaic performances and microstructure are also discussed.
format	Conference or Workshop Item
author	Muhida, Riza Sutjipto, Agus Geter Edy Matsui, T. Toyama, T. Okamoto, H.
author_facet	Muhida, Riza Sutjipto, Agus Geter Edy Matsui, T. Toyama, T. Okamoto, H.
author_sort	Muhida, Riza
title	Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate
title_short	Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate
title_full	Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate
title_fullStr	Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate
title_full_unstemmed	Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate
title_sort	measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate
publishDate	2006
url	http://irep.iium.edu.my/9439/ http://irep.iium.edu.my/9439/1/Poly_Si_-_IEEE_2006.pdf
first_indexed	2023-09-18T20:19:08Z
last_indexed	2023-09-18T20:19:08Z
_version_	1777407988637630464

Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate

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