Classical equivalent circuit characterization for a double-layer capacitor

A supercapacitor or EDLC stores energy in the same way as parallel plate capacitor but in a more complicated nature. The non-ideal device can be represented by a simple equivalent circuit consists of a capacitor and a resistor components. The characterization of these components can be done by condu...

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Main Authors:	Ab Rahim, Abdul Hakim, Ramli, Nabihah, Nordin, Anis Nurashikin, Othman, Raihan, Asrar, Waqar, Sulaeman, Erwin
Format:	Conference or Workshop Item
Language:	English English
Published:	Institute of Electrical and Electronics Engineers Inc. 2018
Subjects:	TJ227 Machine design and drawing
Online Access:	http://irep.iium.edu.my/70099/ http://irep.iium.edu.my/70099/ http://irep.iium.edu.my/70099/ http://irep.iium.edu.my/70099/1/70099_Classical%20equivalent%20circuit%20characterization_SCOPUS.pdf http://irep.iium.edu.my/70099/7/70099_International%20parental%20child%20abduction.pdf

id	iium-70099
recordtype	eprints
spelling	iium-700992019-01-28T00:53:31Z http://irep.iium.edu.my/70099/ Classical equivalent circuit characterization for a double-layer capacitor Ab Rahim, Abdul Hakim Ramli, Nabihah Nordin, Anis Nurashikin Othman, Raihan Asrar, Waqar Sulaeman, Erwin TJ227 Machine design and drawing A supercapacitor or EDLC stores energy in the same way as parallel plate capacitor but in a more complicated nature. The non-ideal device can be represented by a simple equivalent circuit consists of a capacitor and a resistor components. The characterization of these components can be done by conducting transient analysis charge-discharge-cycle (CDC). This paper is reporting the findings of CDC procedures done on a commercial supercapacitor device with rated 2.7 V 350 F and 2.5 miliohms equivalent series resistance (ESR). Two procedures; a standard CDC and manufacturer recommended CDC were done and the results are discussed. The resulting capacitance values are close to the rated value although the ESR value is much higher than to the device datasheet. Institute of Electrical and Electronics Engineers Inc. 2018 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/70099/1/70099_Classical%20equivalent%20circuit%20characterization_SCOPUS.pdf application/pdf en http://irep.iium.edu.my/70099/7/70099_International%20parental%20child%20abduction.pdf Ab Rahim, Abdul Hakim and Ramli, Nabihah and Nordin, Anis Nurashikin and Othman, Raihan and Asrar, Waqar and Sulaeman, Erwin (2018) Classical equivalent circuit characterization for a double-layer capacitor. In: 4th IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) 2017, 28th-30th November 2017, Putrajaya. https://ieeexplore.ieee.org/document/8312015/authors 10.1109/ICSIMA.2017.8312015
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English English
topic	TJ227 Machine design and drawing
spellingShingle	TJ227 Machine design and drawing Ab Rahim, Abdul Hakim Ramli, Nabihah Nordin, Anis Nurashikin Othman, Raihan Asrar, Waqar Sulaeman, Erwin Classical equivalent circuit characterization for a double-layer capacitor
description	A supercapacitor or EDLC stores energy in the same way as parallel plate capacitor but in a more complicated nature. The non-ideal device can be represented by a simple equivalent circuit consists of a capacitor and a resistor components. The characterization of these components can be done by conducting transient analysis charge-discharge-cycle (CDC). This paper is reporting the findings of CDC procedures done on a commercial supercapacitor device with rated 2.7 V 350 F and 2.5 miliohms equivalent series resistance (ESR). Two procedures; a standard CDC and manufacturer recommended CDC were done and the results are discussed. The resulting capacitance values are close to the rated value although the ESR value is much higher than to the device datasheet.
format	Conference or Workshop Item
author	Ab Rahim, Abdul Hakim Ramli, Nabihah Nordin, Anis Nurashikin Othman, Raihan Asrar, Waqar Sulaeman, Erwin
author_facet	Ab Rahim, Abdul Hakim Ramli, Nabihah Nordin, Anis Nurashikin Othman, Raihan Asrar, Waqar Sulaeman, Erwin
author_sort	Ab Rahim, Abdul Hakim
title	Classical equivalent circuit characterization for a double-layer capacitor
title_short	Classical equivalent circuit characterization for a double-layer capacitor
title_full	Classical equivalent circuit characterization for a double-layer capacitor
title_fullStr	Classical equivalent circuit characterization for a double-layer capacitor
title_full_unstemmed	Classical equivalent circuit characterization for a double-layer capacitor
title_sort	classical equivalent circuit characterization for a double-layer capacitor
publisher	Institute of Electrical and Electronics Engineers Inc.
publishDate	2018
url	http://irep.iium.edu.my/70099/ http://irep.iium.edu.my/70099/ http://irep.iium.edu.my/70099/ http://irep.iium.edu.my/70099/1/70099_Classical%20equivalent%20circuit%20characterization_SCOPUS.pdf http://irep.iium.edu.my/70099/7/70099_International%20parental%20child%20abduction.pdf
first_indexed	2023-09-18T21:39:31Z
last_indexed	2023-09-18T21:39:31Z
_version_	1777413046146170880

Classical equivalent circuit characterization for a double-layer capacitor

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