An effective vision technique for microchip lead inspection

A new effective method for the microchip lead inspection for the chip manufacturing industry has been developed in this work. In contrast to the gray scale pattern matching technique this approach employs selected parameters of binary blobs to perform fault detection and measurements. This lead...

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Main Authors:	Mir-Nassiri, Nazim, Al-Obaidy, Haitham H.L, Salami, Momoh Jimoh Eyiomika, Amin, Shamsuddin
Format:	Conference or Workshop Item
Language:	English
Published:	2003
Subjects:	T Technology (General)
Online Access:	http://irep.iium.edu.my/6943/ http://irep.iium.edu.my/6943/1/An_Effective_Vision_Technique_for_Microchip_Lead_Inspection.pdf

id	iium-6943
recordtype	eprints
spelling	iium-69432013-05-08T03:21:33Z http://irep.iium.edu.my/6943/ An effective vision technique for microchip lead inspection Mir-Nassiri, Nazim Al-Obaidy, Haitham H.L Salami, Momoh Jimoh Eyiomika Amin, Shamsuddin T Technology (General) A new effective method for the microchip lead inspection for the chip manufacturing industry has been developed in this work. In contrast to the gray scale pattern matching technique this approach employs selected parameters of binary blobs to perform fault detection and measurements. This leads to a significant reduction of image processing time. A special combination of gray level filtering techniques with gray morphological operations enhances the borders of the lead images. Newly developed threshold calibration technique significantly improves the measurement accuracy. A unique statistical analysis has been developed to identify all possible lead defects in the chips. This method is rotationally and scale invariant and able to detect defective leads for the chips with different specifications. The minimum required information ahout the microchip is the number of leads. 2003 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/6943/1/An_Effective_Vision_Technique_for_Microchip_Lead_Inspection.pdf Mir-Nassiri, Nazim and Al-Obaidy, Haitham H.L and Salami, Momoh Jimoh Eyiomika and Amin, Shamsuddin (2003) An effective vision technique for microchip lead inspection. In: International Conference on Industrial Technology 2003, 10-12th December 2003, Maribor, Slovenia.
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English
topic	T Technology (General)
spellingShingle	T Technology (General) Mir-Nassiri, Nazim Al-Obaidy, Haitham H.L Salami, Momoh Jimoh Eyiomika Amin, Shamsuddin An effective vision technique for microchip lead inspection
description	A new effective method for the microchip lead inspection for the chip manufacturing industry has been developed in this work. In contrast to the gray scale pattern matching technique this approach employs selected parameters of binary blobs to perform fault detection and measurements. This leads to a significant reduction of image processing time. A special combination of gray level filtering techniques with gray morphological operations enhances the borders of the lead images. Newly developed threshold calibration technique significantly improves the measurement accuracy. A unique statistical analysis has been developed to identify all possible lead defects in the chips. This method is rotationally and scale invariant and able to detect defective leads for the chips with different specifications. The minimum required information ahout the microchip is the number of leads.
format	Conference or Workshop Item
author	Mir-Nassiri, Nazim Al-Obaidy, Haitham H.L Salami, Momoh Jimoh Eyiomika Amin, Shamsuddin
author_facet	Mir-Nassiri, Nazim Al-Obaidy, Haitham H.L Salami, Momoh Jimoh Eyiomika Amin, Shamsuddin
author_sort	Mir-Nassiri, Nazim
title	An effective vision technique for microchip lead inspection
title_short	An effective vision technique for microchip lead inspection
title_full	An effective vision technique for microchip lead inspection
title_fullStr	An effective vision technique for microchip lead inspection
title_full_unstemmed	An effective vision technique for microchip lead inspection
title_sort	effective vision technique for microchip lead inspection
publishDate	2003
url	http://irep.iium.edu.my/6943/ http://irep.iium.edu.my/6943/1/An_Effective_Vision_Technique_for_Microchip_Lead_Inspection.pdf
first_indexed	2023-09-18T20:16:06Z
last_indexed	2023-09-18T20:16:06Z
_version_	1777407798082011136

An effective vision technique for microchip lead inspection

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