Fast spiral-scan atomic force microscopy
In this paper, we describe a new scanning technique for fast atomic force microscopy. In this method, the sample is scanned in a spiral pattern instead of the well established raster pattern. AÂ spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying ampl...
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2009
|
| Subjects: | |
| Online Access: | http://irep.iium.edu.my/566/ http://irep.iium.edu.my/566/ http://irep.iium.edu.my/566/1/Fast_spiral-scan_atomic_force_microscopy.pdf |
| id |
iium-566 |
|---|---|
| recordtype |
eprints |
| spelling |
iium-5662011-07-14T06:50:47Z http://irep.iium.edu.my/566/ Fast spiral-scan atomic force microscopy Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza QH Natural history In this paper, we describe a new scanning technique for fast atomic force microscopy. In this method, the sample is scanned in a spiral pattern instead of the well established raster pattern. AÂ spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x -axis and y -axis of an atomic force microscope (AFM) scanner respectively. The use of the single tone input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device and with relatively small control efforts. Experimental results obtained by implementing this technique on a commercial AFM indicate that high-quality images can be generated at scan frequencies well beyond the raster scans. IOP Publishing 2009 Article PeerReviewed application/pdf en http://irep.iium.edu.my/566/1/Fast_spiral-scan_atomic_force_microscopy.pdf Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza (2009) Fast spiral-scan atomic force microscopy. Nanotechnology, 20 (36). 365503-(4). ISSN 0957-4484 http://stacks.iop.org/0957-4484/20/i=36/a=365503 |
| repository_type |
Digital Repository |
| institution_category |
Local University |
| institution |
International Islamic University Malaysia |
| building |
IIUM Repository |
| collection |
Online Access |
| language |
English |
| topic |
QH Natural history |
| spellingShingle |
QH Natural history Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Fast spiral-scan atomic force microscopy |
| description |
In this paper, we describe a new scanning technique for fast atomic force microscopy. In this method, the sample is scanned in a spiral pattern instead of the well established raster pattern. AÂ spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x -axis and y -axis of an atomic force microscope (AFM) scanner respectively. The use of the single tone input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device and with relatively small control efforts. Experimental results obtained by implementing this technique on a commercial AFM indicate that high-quality images can be generated at scan frequencies well beyond the raster scans. |
| format |
Article |
| author |
Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza |
| author_facet |
Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza |
| author_sort |
Mahmood, Iskandar Al-Thani |
| title |
Fast spiral-scan atomic force microscopy |
| title_short |
Fast spiral-scan atomic force microscopy |
| title_full |
Fast spiral-scan atomic force microscopy |
| title_fullStr |
Fast spiral-scan atomic force microscopy |
| title_full_unstemmed |
Fast spiral-scan atomic force microscopy |
| title_sort |
fast spiral-scan atomic force microscopy |
| publisher |
IOP Publishing |
| publishDate |
2009 |
| url |
http://irep.iium.edu.my/566/ http://irep.iium.edu.my/566/ http://irep.iium.edu.my/566/1/Fast_spiral-scan_atomic_force_microscopy.pdf |
| first_indexed |
2023-09-18T20:07:42Z |
| last_indexed |
2023-09-18T20:07:42Z |
| _version_ |
1777407268977901568 |