Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control

The atomic force microscope (AFM) is a device capable of generating topographic images of sample surfaces with extremely high resolutions down to the atomic level. It is also being used in applications that involve manipulation of matter at a nanoscale. Early AFMs were operated in open loop. As a re...

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Main Authors:	Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza
Format:	Conference or Workshop Item
Language:	English
Published:	2009
Subjects:	Q Science (General) TJ212 Control engineering
Online Access:	http://irep.iium.edu.my/5305/ http://irep.iium.edu.my/5305/ http://irep.iium.edu.my/5305/1/Improvement_of_accuracy_and_speed_of_a_commercial_AFM_using_positive_position_feedback_control.pdf

id	iium-5305
recordtype	eprints
spelling	iium-53052011-10-31T08:39:20Z http://irep.iium.edu.my/5305/ Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Q Science (General) TJ212 Control engineering The atomic force microscope (AFM) is a device capable of generating topographic images of sample surfaces with extremely high resolutions down to the atomic level. It is also being used in applications that involve manipulation of matter at a nanoscale. Early AFMs were operated in open loop. As a result, they were susceptible to piezoelectric creep, thermal drift, hysteresis nonlinearity and scan-induced vibration. These effects tend to distort the generated image. The distortions are often minimized by limiting the scanning speed and range of the AFMs. Recently a new generation of AFMs has emerged that utilizes position sensors to measure displacements of the scanner in three dimensions. These AFMs are equipped with feedback loops that work to minimize the adverse effects of hysteresis, piezoelectric creep and thermal drift on the obtained image using standard PI controllers. These feedback controllers are often not designed to deal with the highly resonant nature of an AFM's scanner, nor with the cross-coupling between various axes. In this paper we illustrate the drastic improvement in accuracy and imaging speed that can be obtained by proper design of a feedback controller. Such controllers can be incorporated into most modern AFMs with minimal effort since they can be implemented in software with the existing hardware. 2009-06 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/5305/1/Improvement_of_accuracy_and_speed_of_a_commercial_AFM_using_positive_position_feedback_control.pdf Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza (2009) Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control. In: American Control Conference, 10 - 12 June 2009, Hyatt Regency Riverfront, St. Louis, MO, USA. http://a2c2.org/conferences/acc2009/
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English
topic	Q Science (General) TJ212 Control engineering
spellingShingle	Q Science (General) TJ212 Control engineering Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control
description	The atomic force microscope (AFM) is a device capable of generating topographic images of sample surfaces with extremely high resolutions down to the atomic level. It is also being used in applications that involve manipulation of matter at a nanoscale. Early AFMs were operated in open loop. As a result, they were susceptible to piezoelectric creep, thermal drift, hysteresis nonlinearity and scan-induced vibration. These effects tend to distort the generated image. The distortions are often minimized by limiting the scanning speed and range of the AFMs. Recently a new generation of AFMs has emerged that utilizes position sensors to measure displacements of the scanner in three dimensions. These AFMs are equipped with feedback loops that work to minimize the adverse effects of hysteresis, piezoelectric creep and thermal drift on the obtained image using standard PI controllers. These feedback controllers are often not designed to deal with the highly resonant nature of an AFM's scanner, nor with the cross-coupling between various axes. In this paper we illustrate the drastic improvement in accuracy and imaging speed that can be obtained by proper design of a feedback controller. Such controllers can be incorporated into most modern AFMs with minimal effort since they can be implemented in software with the existing hardware.
format	Conference or Workshop Item
author	Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza
author_facet	Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza
author_sort	Mahmood, Iskandar Al-Thani
title	Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control
title_short	Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control
title_full	Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control
title_fullStr	Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control
title_full_unstemmed	Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control
title_sort	improvement of accuracy and speed of a commercial afm using positive position feedback control
publishDate	2009
url	http://irep.iium.edu.my/5305/ http://irep.iium.edu.my/5305/ http://irep.iium.edu.my/5305/1/Improvement_of_accuracy_and_speed_of_a_commercial_AFM_using_positive_position_feedback_control.pdf
first_indexed	2023-09-18T20:13:50Z
last_indexed	2023-09-18T20:13:50Z
_version_	1777407654739574784

Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control

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