Mahmood, I. A., & Moheimani, S. R. (2009). Making a commercial atomic force microscope more accurate and faster using positive position feedback control. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationMahmood, Iskandar Al-Thani, and S.O. Reza Moheimani. Making a Commercial Atomic Force Microscope More Accurate and Faster Using Positive Position Feedback Control. American Institute of Physics (AIP), 2009.
MLA (8th ed.) CitationMahmood, Iskandar Al-Thani, and S.O. Reza Moheimani. Making a Commercial Atomic Force Microscope More Accurate and Faster Using Positive Position Feedback Control. American Institute of Physics (AIP), 2009.
Warning: These citations may not always be 100% accurate.