Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan

Unpredictable work-in-process (WIP) inventory developed in the inspection area of an integrated circuit (IC) assembly line due to the acceptance criteria dictated by a single sampling plan often requires additional human resources and results in longer production lead time. Sudden need of additional...

Full description

Bibliographic Details
Main Authors:	Karim, A.N. Mustafizul, Abd. Rahman, Mohamed, Hj. Yusop, Nornilawati
Format:	Conference or Workshop Item
Language:	English English
Published:	2014
Subjects:	TS Manufactures
Online Access:	http://irep.iium.edu.my/40562/ http://irep.iium.edu.my/40562/ http://irep.iium.edu.my/40562/1/MITIGATION_OF_WIP-RELATED_PROBLEMS.pdf http://irep.iium.edu.my/40562/4/40562.pdf

id	iium-40562
recordtype	eprints
spelling	iium-405622018-06-20T08:41:17Z http://irep.iium.edu.my/40562/ Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan Karim, A.N. Mustafizul Abd. Rahman, Mohamed Hj. Yusop, Nornilawati TS Manufactures Unpredictable work-in-process (WIP) inventory developed in the inspection area of an integrated circuit (IC) assembly line due to the acceptance criteria dictated by a single sampling plan often requires additional human resources and results in longer production lead time. Sudden need of additional operators to carry out 100% inspection of the rejected lot creates an uneasy and difficult situation for the concerned manager. Securing outgoing quality of the ICs without increasing the production lead time and allocation of additional human resources appears to be a major challenge. Upon a critical study of a real-life assembly line, several sampling plans (double and multiple) which could adequately meet the current average outgoing quality limit (AOQL), a parameter indicating the level of outgoing lot quality, were applied. A multiple sampling plan was suggested to minimize the WIP level with a reduction in consequential effect on the line of operation. The proposed multiple sampling plan is expected to increase the average total inspection (ATI) but the benefits to be accrued through minimization of WIP level and the minimized resources in tackling the situation should outweigh the efforts for additional inspection involving only visual observation without carrying out any expensive destructive tests. 2014-01 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/40562/1/MITIGATION_OF_WIP-RELATED_PROBLEMS.pdf application/pdf en http://irep.iium.edu.my/40562/4/40562.pdf Karim, A.N. Mustafizul and Abd. Rahman, Mohamed and Hj. Yusop, Nornilawati (2014) Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan. In: International Conference on Industrial Engineering and Operations Management, 7th-9th Jan. 2014, Bali, Indonesia. http://iieom.org/ieom2014/index.html
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English English
topic	TS Manufactures
spellingShingle	TS Manufactures Karim, A.N. Mustafizul Abd. Rahman, Mohamed Hj. Yusop, Nornilawati Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan
description	Unpredictable work-in-process (WIP) inventory developed in the inspection area of an integrated circuit (IC) assembly line due to the acceptance criteria dictated by a single sampling plan often requires additional human resources and results in longer production lead time. Sudden need of additional operators to carry out 100% inspection of the rejected lot creates an uneasy and difficult situation for the concerned manager. Securing outgoing quality of the ICs without increasing the production lead time and allocation of additional human resources appears to be a major challenge. Upon a critical study of a real-life assembly line, several sampling plans (double and multiple) which could adequately meet the current average outgoing quality limit (AOQL), a parameter indicating the level of outgoing lot quality, were applied. A multiple sampling plan was suggested to minimize the WIP level with a reduction in consequential effect on the line of operation. The proposed multiple sampling plan is expected to increase the average total inspection (ATI) but the benefits to be accrued through minimization of WIP level and the minimized resources in tackling the situation should outweigh the efforts for additional inspection involving only visual observation without carrying out any expensive destructive tests.
format	Conference or Workshop Item
author	Karim, A.N. Mustafizul Abd. Rahman, Mohamed Hj. Yusop, Nornilawati
author_facet	Karim, A.N. Mustafizul Abd. Rahman, Mohamed Hj. Yusop, Nornilawati
author_sort	Karim, A.N. Mustafizul
title	Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan
title_short	Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan
title_full	Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan
title_fullStr	Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan
title_full_unstemmed	Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan
title_sort	mitigation of wip-related problems at an ic production line through a suitable inspection sampling plan
publishDate	2014
url	http://irep.iium.edu.my/40562/ http://irep.iium.edu.my/40562/ http://irep.iium.edu.my/40562/1/MITIGATION_OF_WIP-RELATED_PROBLEMS.pdf http://irep.iium.edu.my/40562/4/40562.pdf
first_indexed	2023-09-18T20:58:13Z
last_indexed	2023-09-18T20:58:13Z
_version_	1777410447659499520

Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan

Similar Items