Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy

Piezoelectric tube scanner is a major component that used in nanoscale imaging tools such as atomic force microscopy (AFM). This is because it can provide precise nanoscale positioning. However the precision is limited by vibration and some nonlinear drawbacks represented by creep and hysteresis. H...

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Main Authors:	Othman, Yahya Sheriff, Mahmood, Iskandar Al-Thani, Alang Md Rashid, Nahrul Khair, Ridhuan Siradj , Fadly Jashi Darsivan
Format:	Article
Language:	English
Published:	IEEE Xplore 2012
Subjects:	TJ212 Control engineering
Online Access:	http://irep.iium.edu.my/34971/ http://irep.iium.edu.my/34971/ http://irep.iium.edu.my/34971/ http://irep.iium.edu.my/34971/2/06412244.pdf

id	iium-34971
recordtype	eprints
spelling	iium-349712014-02-11T03:07:50Z http://irep.iium.edu.my/34971/ Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy Othman, Yahya Sheriff Mahmood, Iskandar Al-Thani Alang Md Rashid, Nahrul Khair Ridhuan Siradj , Fadly Jashi Darsivan TJ212 Control engineering Piezoelectric tube scanner is a major component that used in nanoscale imaging tools such as atomic force microscopy (AFM). This is because it can provide precise nanoscale positioning. However the precision is limited by vibration and some nonlinear drawbacks represented by creep and hysteresis. Hysteresis problem appears when positioning is needed at wide range. In this paper, a feed forward multi-layer neural network (MLNN) is trained to shape a proper control signal based on reference input and actual output signals. The experimental results show that the developed neural network scheme improves the performance of the system by significantly minimizing the effect of hysteresis. IEEE Xplore 2012 Article PeerReviewed application/pdf en http://irep.iium.edu.my/34971/2/06412244.pdf Othman, Yahya Sheriff and Mahmood, Iskandar Al-Thani and Alang Md Rashid, Nahrul Khair and Ridhuan Siradj , Fadly Jashi Darsivan (2012) Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy. IEEE Region 10 Annual International Conference, Proceedings/TENCON. pp. 1-5. ISSN 2159-3442 http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6412244&tag=1 Article no. 6412244
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English
topic	TJ212 Control engineering
spellingShingle	TJ212 Control engineering Othman, Yahya Sheriff Mahmood, Iskandar Al-Thani Alang Md Rashid, Nahrul Khair Ridhuan Siradj , Fadly Jashi Darsivan Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy
description	Piezoelectric tube scanner is a major component that used in nanoscale imaging tools such as atomic force microscopy (AFM). This is because it can provide precise nanoscale positioning. However the precision is limited by vibration and some nonlinear drawbacks represented by creep and hysteresis. Hysteresis problem appears when positioning is needed at wide range. In this paper, a feed forward multi-layer neural network (MLNN) is trained to shape a proper control signal based on reference input and actual output signals. The experimental results show that the developed neural network scheme improves the performance of the system by significantly minimizing the effect of hysteresis.
format	Article
author	Othman, Yahya Sheriff Mahmood, Iskandar Al-Thani Alang Md Rashid, Nahrul Khair Ridhuan Siradj , Fadly Jashi Darsivan
author_facet	Othman, Yahya Sheriff Mahmood, Iskandar Al-Thani Alang Md Rashid, Nahrul Khair Ridhuan Siradj , Fadly Jashi Darsivan
author_sort	Othman, Yahya Sheriff
title	Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy
title_short	Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy
title_full	Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy
title_fullStr	Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy
title_full_unstemmed	Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy
title_sort	artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy
publisher	IEEE Xplore
publishDate	2012
url	http://irep.iium.edu.my/34971/ http://irep.iium.edu.my/34971/ http://irep.iium.edu.my/34971/ http://irep.iium.edu.my/34971/2/06412244.pdf
first_indexed	2023-09-18T20:50:17Z
last_indexed	2023-09-18T20:50:17Z
_version_	1777409947959558144

Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy

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