Design of capacitive measuring systems for high frequency band sensor transducer
A 0.13-μm complementary metal-oxide-semiconductor (CMOS) technology capacitive measuring system has been proposed for detection a wide range of capacitance variation values by using less than 1.2-V supply voltage. Simulation results have successfully verified the function of the design is able to me...
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iium-33842012-08-08T06:24:26Z http://irep.iium.edu.my/3384/ Design of capacitive measuring systems for high frequency band sensor transducer Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz TK Electrical engineering. Electronics Nuclear engineering A 0.13-μm complementary metal-oxide-semiconductor (CMOS) technology capacitive measuring system has been proposed for detection a wide range of capacitance variation values by using less than 1.2-V supply voltage. Simulation results have successfully verified the function of the design is able to measure both small and large capacitance variations. Capacitance to Voltage Converter (CVC) system is suitable to be used in a later system of high frequency system. This converter also results to a lower power consumption with the supply voltage of ±1.2V in the circuit systems. 2010 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/3384/1/05556850.pdf Arfah, Nurul and Alam, A. H. M. Zahirul and Khan, Sheroz (2010) Design of capacitive measuring systems for high frequency band sensor transducer. In: International Conference on Computer and Communication Engineering (ICCCE 2010), 11-13 May 2010, Kuala Lumpur. http://dx.doi.org/10.1109/ICCCE.2010.5556850 doi:10.1109/ICCCE.2010.5556850 |
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International Islamic University Malaysia |
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Online Access |
language |
English |
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TK Electrical engineering. Electronics Nuclear engineering |
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TK Electrical engineering. Electronics Nuclear engineering Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz Design of capacitive measuring systems for high frequency band sensor transducer |
description |
A 0.13-μm complementary metal-oxide-semiconductor (CMOS) technology capacitive measuring system has been proposed for detection a wide range of capacitance variation values by using less than 1.2-V supply voltage. Simulation results have successfully verified the function of the design is able to measure both small and large capacitance variations. Capacitance to Voltage Converter (CVC) system is suitable to be used in a later system of high frequency system. This converter also results to a lower power consumption with the supply voltage of ±1.2V in the circuit systems. |
format |
Conference or Workshop Item |
author |
Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz |
author_facet |
Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz |
author_sort |
Arfah, Nurul |
title |
Design of capacitive measuring systems for high frequency band sensor transducer |
title_short |
Design of capacitive measuring systems for high frequency band sensor transducer |
title_full |
Design of capacitive measuring systems for high frequency band sensor transducer |
title_fullStr |
Design of capacitive measuring systems for high frequency band sensor transducer |
title_full_unstemmed |
Design of capacitive measuring systems for high frequency band sensor transducer |
title_sort |
design of capacitive measuring systems for high frequency band sensor transducer |
publishDate |
2010 |
url |
http://irep.iium.edu.my/3384/ http://irep.iium.edu.my/3384/ http://irep.iium.edu.my/3384/ http://irep.iium.edu.my/3384/1/05556850.pdf |
first_indexed |
2023-09-18T20:11:12Z |
last_indexed |
2023-09-18T20:11:12Z |
_version_ |
1777407489467219968 |