Structure characterization of electrodeposited zinc selenide thin films

Crystalline thin of zinc selenide have been electrochemically deposited on conducting substrates of indium tin oxide, ITO glass. Initial investigation with voltammetry was done and shows that the zinc selenide films were stable towards oxidation. The best deposition potential obtained was at -0.95...

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Bibliographic Details
Main Authors: Mohamad, Souad A., Basirun, Wan Jefrey, Ibrahim, Zainol Abidin, Mohd Arof, Abdul Kariem, Ebadi, Mehdi
Format: Article
Language:English
Published: Trans Tech Publications, Switzerland 2011
Subjects:
Online Access:http://irep.iium.edu.my/3370/
http://irep.iium.edu.my/3370/
http://irep.iium.edu.my/3370/
http://irep.iium.edu.my/3370/1/AMR.264-265.732.pdf
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Summary:Crystalline thin of zinc selenide have been electrochemically deposited on conducting substrates of indium tin oxide, ITO glass. Initial investigation with voltammetry was done and shows that the zinc selenide films were stable towards oxidation. The best deposition potential obtained was at -0.95 V vs. Ag /AgCl while at lower deposition potentials, the films do not form well. Energy Dispersive Analysis and X-Ray spectrum indicate that the films deposited at 65oC and -0.95 V vs. Ag/AgCl have nearly stoichiometric Zn: Se ratio.