Development and optimization of High-Hertz stress contact to reduce future contact material cost
Reducing a total contact material cost of a connector, a high-Hertz stress with low normal force (LNF) contact will be a key technology in the future. Only an R5m tip with 0.1N force contact provides an excellent electrical performance which is much sharper than conventional connectors. 0.30 millio...
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iium-331892013-12-20T07:21:21Z http://irep.iium.edu.my/33189/ Development and optimization of High-Hertz stress contact to reduce future contact material cost Bhuiyan, Moinul TA401 Materials of engineering and construction Reducing a total contact material cost of a connector, a high-Hertz stress with low normal force (LNF) contact will be a key technology in the future. Only an R5m tip with 0.1N force contact provides an excellent electrical performance which is much sharper than conventional connectors. 0.30 million cycles durability test was passed and the contact resistance was ≦50m-ohm. 2010-10-20 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/33189/1/Development_and_Optimization_of_High-Hertz_Stress_Contact_to_Reduce_Future_Contact_Material_Cost.pdf application/pdf en http://irep.iium.edu.my/33189/4/TE_Technical_Conference_2010.jpg Bhuiyan, Moinul (2010) Development and optimization of High-Hertz stress contact to reduce future contact material cost. In: Tyco Electronics Technical Conference 2010, 18-20 October 2010, San Jose, USA. (Unpublished) http://www.te.com/en/home.html |
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International Islamic University Malaysia |
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language |
English English |
topic |
TA401 Materials of engineering and construction |
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TA401 Materials of engineering and construction Bhuiyan, Moinul Development and optimization of High-Hertz stress contact to reduce future contact material cost |
description |
Reducing a total contact material cost of a connector, a high-Hertz stress with low normal force (LNF) contact will be a key technology in the future. Only an R5m tip with 0.1N force contact provides an excellent electrical performance which is much sharper than conventional connectors. 0.30 million cycles durability test was passed and the contact resistance was ≦50m-ohm. |
format |
Conference or Workshop Item |
author |
Bhuiyan, Moinul |
author_facet |
Bhuiyan, Moinul |
author_sort |
Bhuiyan, Moinul |
title |
Development and optimization of High-Hertz stress contact to
reduce future contact material cost |
title_short |
Development and optimization of High-Hertz stress contact to
reduce future contact material cost |
title_full |
Development and optimization of High-Hertz stress contact to
reduce future contact material cost |
title_fullStr |
Development and optimization of High-Hertz stress contact to
reduce future contact material cost |
title_full_unstemmed |
Development and optimization of High-Hertz stress contact to
reduce future contact material cost |
title_sort |
development and optimization of high-hertz stress contact to
reduce future contact material cost |
publishDate |
2010 |
url |
http://irep.iium.edu.my/33189/ http://irep.iium.edu.my/33189/ http://irep.iium.edu.my/33189/1/Development_and_Optimization_of_High-Hertz_Stress_Contact_to_Reduce_Future_Contact_Material_Cost.pdf http://irep.iium.edu.my/33189/4/TE_Technical_Conference_2010.jpg |
first_indexed |
2023-09-18T20:47:57Z |
last_indexed |
2023-09-18T20:47:57Z |
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1777409801652797440 |