Reverse leakage current mechanisms in quantum dot laser structures
Dark current-voltage measurements undertaken on a series of InAs based quantum dot laser structures show significant variations depending on the growth conditions of the GaAs barrier layer. A systematic study of their temperature dependence suggests that the main mechanism determining the rever...
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iium-176532015-09-09T05:45:40Z http://irep.iium.edu.my/17653/ Reverse leakage current mechanisms in quantum dot laser structures Hasbullah, Nurul Fadzlin David, John P. R. TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices Dark current-voltage measurements undertaken on a series of InAs based quantum dot laser structures show significant variations depending on the growth conditions of the GaAs barrier layer. A systematic study of their temperature dependence suggests that the main mechanism determining the reverse leakage is due to generation–recombination via mid-band traps assisted by Frenkel-Poole emission of carriers from these traps. Since the dark current is a relatively parameter to determine in a device, optimising this is a quicker means of optimising the growth parameters than undertaking full laser testing. I. INTRODUCTION 2011 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/17653/1/IEEE_MnN_vs_7.pdf application/pdf en http://irep.iium.edu.my/17653/4/Reverse_leakage_current_mechanisms_in_quantum.pdf Hasbullah, Nurul Fadzlin and David, John P. R. (2011) Reverse leakage current mechanisms in quantum dot laser structures. In: RSM 2011, 28-30 Sep 2011. http://dx.doi.org/10.1109/RSM.2011.6088285 doi:10.1109/RSM.2011.6088285 |
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International Islamic University Malaysia |
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English English |
topic |
TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices |
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TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices Hasbullah, Nurul Fadzlin David, John P. R. Reverse leakage current mechanisms in quantum dot laser structures |
description |
Dark current-voltage measurements undertaken on a
series of InAs based quantum dot laser structures show
significant variations depending on the growth
conditions of the GaAs barrier layer. A systematic
study of their temperature dependence suggests that
the main mechanism determining the reverse leakage
is due to generation–recombination via mid-band traps
assisted by Frenkel-Poole emission of carriers from
these traps. Since the dark current is a relatively
parameter to determine in a device, optimising this is a
quicker means of optimising the growth parameters
than undertaking full laser testing.
I. INTRODUCTION |
format |
Conference or Workshop Item |
author |
Hasbullah, Nurul Fadzlin David, John P. R. |
author_facet |
Hasbullah, Nurul Fadzlin David, John P. R. |
author_sort |
Hasbullah, Nurul Fadzlin |
title |
Reverse leakage current mechanisms in quantum dot laser structures |
title_short |
Reverse leakage current mechanisms in quantum dot laser structures |
title_full |
Reverse leakage current mechanisms in quantum dot laser structures |
title_fullStr |
Reverse leakage current mechanisms in quantum dot laser structures |
title_full_unstemmed |
Reverse leakage current mechanisms in quantum dot laser structures |
title_sort |
reverse leakage current mechanisms in quantum dot laser structures |
publishDate |
2011 |
url |
http://irep.iium.edu.my/17653/ http://irep.iium.edu.my/17653/ http://irep.iium.edu.my/17653/ http://irep.iium.edu.my/17653/1/IEEE_MnN_vs_7.pdf http://irep.iium.edu.my/17653/4/Reverse_leakage_current_mechanisms_in_quantum.pdf |
first_indexed |
2023-09-18T20:26:38Z |
last_indexed |
2023-09-18T20:26:38Z |
_version_ |
1777408459962056704 |