The use of scanning electron microscope in evaluating insulation property
Main Authors: | Sutjipto, Agus Geter Edy, Afzeri, Afzeri, Muhida, Riza, Sopyan, Iis, Haruman, Esa |
---|---|
Format: | Book Chapter |
Language: | English |
Published: |
IIUM Press
2011
|
Subjects: | |
Online Access: | http://irep.iium.edu.my/17609/ http://irep.iium.edu.my/17609/1/Chapter_20.pdf |
Similar Items
-
The possibility of utilizing scanning electron microscope for materials characterization
by: Sutjipto, Agus Geter Edy
Published: (2011) -
Selection of materials and design specification for hip oint prosthesis
by: Sopyan, Iis, et al.
Published: (2011) -
A maximum power point tracking for Photovoltaic system using temperature compensator method
by: Muhida, Riza, et al.
Published: (2011) -
Pin type reconfigurable clamping ability evaluation for setup-free technology
by: Afzeri, Afzeri, et al.
Published: (2011) -
Modeling electric field distribution on insulator under electron bombardment in vacuum
by: Sutjipto, Agus Geter Edy, et al.
Published: (2010)