CMOS Op amp testing for capacitive measuring systems application

Operational amplifier (Op amp) is the most integral part of an embedded circuit building block. In this paper, the testing of an integrated Op amp suitable use for capacitance and high speed measuring system has been made. The Op amp testing (such as large signal differential transfer characteristic...

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Main Authors:	Arfah, Nurul, Alam, A. H. M. Zahirul, Khan, Sheroz
Format:	Conference or Workshop Item
Language:	English
Published:	2011
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://irep.iium.edu.my/11860/ http://irep.iium.edu.my/11860/ http://irep.iium.edu.my/11860/1/CMOS_Op_amp_testing_for_capacitive_measuring_systems_application.pdf

id	iium-11860
recordtype	eprints
spelling	iium-118602019-02-11T04:47:17Z http://irep.iium.edu.my/11860/ CMOS Op amp testing for capacitive measuring systems application Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz TK Electrical engineering. Electronics Nuclear engineering Operational amplifier (Op amp) is the most integral part of an embedded circuit building block. In this paper, the testing of an integrated Op amp suitable use for capacitance and high speed measuring system has been made. The Op amp testing (such as large signal differential transfer characteristic, frequency respond analysis, input common mode analysis, slew rate analysis) has been done using the PSpice OrCAD Version 16.0 circuit simulator and simulation results were compared with the design specification. The design of this Op amp for capacitive measuring system is making use of 0.13 μm complementary metal-oxide-semiconductor (CMOS) technology. This high speed and low power consumption system design is suitable use in a measuring system for detection a wide and lower range of capacitance. 2011-12-01 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/11860/1/CMOS_Op_amp_testing_for_capacitive_measuring_systems_application.pdf Arfah, Nurul and Alam, A. H. M. Zahirul and Khan, Sheroz (2011) CMOS Op amp testing for capacitive measuring systems application. In: 2011 IEEE Regional Symposium on Micro and Nanoelectronics (RSM 2011), 28-30 September, Kota Kinabalu, Malaysia. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6088318
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English
topic	TK Electrical engineering. Electronics Nuclear engineering
spellingShingle	TK Electrical engineering. Electronics Nuclear engineering Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz CMOS Op amp testing for capacitive measuring systems application
description	Operational amplifier (Op amp) is the most integral part of an embedded circuit building block. In this paper, the testing of an integrated Op amp suitable use for capacitance and high speed measuring system has been made. The Op amp testing (such as large signal differential transfer characteristic, frequency respond analysis, input common mode analysis, slew rate analysis) has been done using the PSpice OrCAD Version 16.0 circuit simulator and simulation results were compared with the design specification. The design of this Op amp for capacitive measuring system is making use of 0.13 μm complementary metal-oxide-semiconductor (CMOS) technology. This high speed and low power consumption system design is suitable use in a measuring system for detection a wide and lower range of capacitance.
format	Conference or Workshop Item
author	Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz
author_facet	Arfah, Nurul Alam, A. H. M. Zahirul Khan, Sheroz
author_sort	Arfah, Nurul
title	CMOS Op amp testing for capacitive measuring systems application
title_short	CMOS Op amp testing for capacitive measuring systems application
title_full	CMOS Op amp testing for capacitive measuring systems application
title_fullStr	CMOS Op amp testing for capacitive measuring systems application
title_full_unstemmed	CMOS Op amp testing for capacitive measuring systems application
title_sort	cmos op amp testing for capacitive measuring systems application
publishDate	2011
url	http://irep.iium.edu.my/11860/ http://irep.iium.edu.my/11860/ http://irep.iium.edu.my/11860/1/CMOS_Op_amp_testing_for_capacitive_measuring_systems_application.pdf
first_indexed	2023-09-18T20:21:07Z
last_indexed	2023-09-18T20:21:07Z
_version_	1777408113039638528

CMOS Op amp testing for capacitive measuring systems application

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