Testing for EMC compliance approaches and techniques

Bibliographic Details
Main Author: Montrose
Other Authors: Nakauchi
Format: Book
Language:English
Published: Hoboken, NJ John Wiley 2004.
Subjects:
Description
Physical Description:xviii, 460 p. ill. 24 cm.
Bibliography:Includes bibliographical references (p. 447-451) and index.
ISBN:047143308X (cloth)